New Measurement Technique for Complex Permittivity in Millimeter-Wave Band Using Simple Rectangular Waveguide Adapters

This research presents a novel methodology for measuring the complex permittivity of material under test (MUT) in millimeter-wave (mmWave) band by using two rectangular waveguide adapters. Contrary to conventional Nicolson-Ross-Weir (NRW) method, proposed measurement method does not require fabrication process exact MUT insertion into waveguide. In our measurement, simple commercial adapters are employed instead large flange structures. The non-destructive is achieved combining NRW Gaussian weighting moving average filtering technique, full-wave electromagnetic analysis, and an optimization technique. Furthermore, validated fabricating Teflon-based Ka (26.5–40 GHz). results indicate that exhibits good agreement with data sheet.